BEQIRI, Mitasin; SALIU, Senat; NESHKOVSKA, Maja. SCANNING ELECTRON MICROSCOPY (SEM/EDX) IN FORENSIC SCIENCES: APPLICATION IN THE ANALYSIS OF GUNSHOT RESIDUES. KNOWLEDGE - International Journal , [S. l.], v. 77, n. 1, p. 141–147, 2026. Disponível em: https://ojs.ikm.mk/index.php/kij/article/view/8455. Acesso em: 22 aug. 2026.